Patent · US Active

Metrology target indentification, design and verification

US9546946B2 · kind B2 · utility

2Cited by
10References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 28, 2014
Grant dateJan 17, 2017
Priority date
Expiry dateSep 6, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG10K2210/129
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Metrology tools are provided, which comprise both active and passive vibration isolation devices, passive or active isolation systems such as constrained layer dampers, particle impact dampers or liquid impact dampers, and/or noise cancellation transducers, combined in different supporting structures of the metrology tool to dampen and reduce vibrations at a wide range of frequencies and intensities, and to which frequency range spectral analysis and optimization may be applied to determine specific tool configurations according to the provided principles.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.