Patent · US Active

Resistive memory with program verify and erase verify capability

US9548116B2 · kind B2 · utility

36Cited by
4References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 26, 2014
Grant dateJan 17, 2017
Priority date
Expiry dateDec 27, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2013/0078
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A resistive non-volatile memory cell is programmed. A programming voltage is applied to a first terminal of the resistive non-volatile memory cell. Sensing, during the applying the programming voltage, determines if the resistive non-volatile memory cell has been programmed. Current is limited through the resistive non-volatile memory cell to a first magnitude. After a predetermined time, if the sensing has not detected that the resistive non-volatile memory cell has been programmed, the current through the resistive non-volatile memory cell is limited to a second magnitude greater than the first magnitude. The resistive non-volatile memory cell is also erased.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.