Patent · US Active

Integrated circuit defect detection and repair

US9548137B2 · kind B2 · utility

2Cited by

25References

25Claims

0Family size

Assignee

Intel Corporation · US

Inventors

Bruce Querbach · Hillsboro, US
William K. Lui · Portland, US
David G. Ellis · Tualatin, US
David J. Zimmerman · Cameron Park, US
Theodore Z. Schoenborn · Portland, US
Christopher W. Hampson · Hillsboro, US
Ifar Wan · Hillsboro, US
Yulan Zhang · Chizhou City, CN

Key dates

Filing date	Jun 30, 2014
Grant date	Jan 17, 2017
Priority date	—
Expiry date	Jun 30, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/4402
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

In accordance with the present description, a device includes an internal defect detection and repair circuit which includes a self-test logic circuit built in within the device and a self-repair logic circuit also built in within the device. In one embodiment, the built in self-test logic circuit may be configured to automatically identify defective memory cells in a memory. Upon identifying one or more defective memory cells, the built in self-repair logic circuit may be configured to automatically repair the defective memory cells by replacing defective cells with spare cells within the memory.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.