System and method for determining a displaced substrate with a vision system
US9554094B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 12, 2013 |
| Grant date | Jan 24, 2017 |
| Priority date | — |
| Expiry date | Jun 4, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30141
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A system and method for detecting and/or determining the existence of displacement of a substrate with respect to a surrounding object uses a laser line that is free of contact with the object and that is received by an image sensor. A processor reads the line information in a series of image frames, and generates a range image with height information. The height information is provided to a 2D map. Differences between adjacent height measurements, and averages, are computed. Vision system tools are used to accurately locate features in the image and these are aligned with the height information. The height differences are interpreted, with missing height data due, for example, to specularity in the image being approximated. The height differences are compared to predetermined height parameters relative to identified locations, for example, wells, in the object to determine whether a substrate is displaced.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.