Patent · US Active

Monomer, hardmask composition including monomer, and method for forming pattern by using hardmask composition

US9556094B2 · kind B2 · utility

3Cited by
4References
15Claims
0Family size

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Inventors

Key dates

Filing dateJun 4, 2013
Grant dateJan 31, 2017
Priority date
Expiry dateJun 4, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/11
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Disclosed are a monomer represented by the following Chemical Formula 1 for a hardmask composition, a hardmask composition including the monomer, and a method of forming patterns using the hardmask composition.In the above Chemical Formula 1,A1 to A3, X1 to X3, L1, L2, n and m are the same as described in the detailed description.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.