Defect logging in nonvolatile memory
US9558847B2 · kind B2 · utility
3Cited by
0References
22Claims
0Family size
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Key dates
| Filing date | Nov 21, 2014 |
| Grant date | Jan 31, 2017 |
| Priority date | — |
| Expiry date | Nov 21, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of operating a nonvolatile memory block includes reading data from physical units in the block and determining individual error rates for data from the physical units. The error rate data is stored. This is repeated over multiple iterations and aggregated stored error rates are used to identify bad physical units in the block.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.