Automatic analysis device and automatic analysis program
US9562917B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 17, 2012 |
| Grant date | Feb 7, 2017 |
| Priority date | — |
| Expiry date | Mar 23, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/0453
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Accuracy control of an automatic analysis device that mixes a sample and a reagent to measure temporal change of a mixed solution is realized. A plurality of measurement point data is acquired from a reaction process of the sample and the reagent. Parameters and test values of approximate equations for approximating the plurality of measurement point data are accumulated in a storage unit. A distribution map of reference data corresponding to the parameters or the test values is created based on predetermined numbers of the parameters or the test values accumulated in the storage unit. Next, a plurality of screens for individually superimposing, on the distribution map, curved lines corresponding to a plurality of regression function candidates obtained by applying a plurality of regression functions are arranged and presented on a display screen, so as to approximate the data to the distribution map of the reference data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.