Semi-auto scanning probe microscopy scanning
US9586817B2 · kind B2 · utility
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49References
16Claims
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Key dates
| Filing date | Jul 26, 2012 |
| Grant date | Mar 7, 2017 |
| Priority date | — |
| Expiry date | Jul 26, 2032 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y35/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A semi-automated method for atomic force microscopy (“AFM”) scanning of a sample is disclosed. The method can include manually teaching a sample and AFM tip relative location on an AFM tool; then scanning, via a predefined program, on the same sample or other sample with same pattern to produce more images automatically.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.