Inventor · Ellsworth, WI, US

Peter Gunderson

11Patents
2h-index
17Co-inventors
47Inventor score

Filing activity: Mar 16, 2009 → Mar 20, 2019

Most-cited inventions

PatentTitleAreaCited byStatus
US8296860B2 Atomic force microscopy true shape measurement method Physics 6 Active
US8525112B2 Variable pixel density imaging Performing Operations; Transporting 2 Active
US9689743B2 Accuracy and precision in raman spectroscopy Physics 2 Active
US9527732B2 Methods and devices for correcting errors in atomic force microscopy Physics 2 Active
US8371155B2 Scanning probe microscopy employing correlation pattern recognition Physics 1 Active
US10147448B2 High flow packaging for slider cleaning Performing Operations; Transporting 0 Active
US9685176B2 Process to inhibit slider contamination during processing Emerging Cross-Sectional Technologies 0 Active
US10319396B2 Transducer bar translation system and method of translating a transducer bar Physics 0 Active
US9586817B2 Semi-auto scanning probe microscopy scanning Performing Operations; Transporting 0 Active
US10144901B2 Lubricant composition for lapping ceramic material, and related methods Chemistry; Metallurgy 0 Active
US11037593B1 Methods of separating one or more substrates that are adhesively bonded to a carrier, and related systems and apparatuses Chemistry; Metallurgy 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.