Method for varying the scanning field of a laser scanning microscope
US9594237B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 26, 2012 |
| Grant date | Mar 14, 2017 |
| Priority date | — |
| Expiry date | Dec 31, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/008
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Disclosed is a method for varying the size of the scanning field of a multifocal laser scanning microscope, said scanning field being scanned in X columns and Y lines, and n laser spots being arranged at a distance d from one another in the scanning field along the slow scanning axis in the sample plane, the distance between the scanned lines in the sample plane being a=d/K, where KεN, the size of the scanning field being varied by varying K. After scanning K lines, a vertical skip is made, e.g. a skip of (n−1)×K+1 lines in the scanning direction or (n+1)×K−1 lines against the scanning direction until at least Y lines have been scanned.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.