Estimating flash quality using selective error emphasis
US9594615B2 · kind B2 · utility
2Cited by
10References
20Claims
0Family size
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Key dates
| Filing date | Sep 30, 2014 |
| Grant date | Mar 14, 2017 |
| Priority date | — |
| Expiry date | Jan 17, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/42
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for data storage includes reading from a memory device data that is stored in a group of memory cells as respective analog values, and classifying readout errors in the read data into at least first and second different types, depending on zones in which the analog values fall. A memory quality that emphasizes the readout errors of the second type is assigned to the group of the memory cells, based on evaluated numbers of the readout errors of the first and second types.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.