Inventor · Nes Ziona, IL

Yael Shur

17Patents

4h-index

18Co-inventors

49Inventor score

Filing activity: Dec 10, 2012 → Feb 20, 2019

Most-cited inventions

Patent	Title	Area	Cited by	Status
US9330783B1	Identifying word-line-to-substrate and word-line-to-word-line short-circuit events in a memory block	Physics	14	Active
US10008278B1	Memory block usage based on block location relative to array edge	Physics	11	Active
US8773905B1	Identifying and mitigating restricted sampling voltage ranges in analog memory cells	Physics	10	Active
US9390809B1	Data storage in a memory block following WL-WL short	Physics	8	Active
US8717826B1	Estimation of memory cell wear level based on saturation current	Physics	4	Active
US8824214B2	Inter-word-line programming in arrays of analog memory cells	Physics	3	Active
US10936456B1	Handling malfunction in a memory system comprising a nonvolatile memory by monitoring bad-block patterns	Physics	2	Active
US9594615B2	Estimating flash quality using selective error emphasis	Physics	2	Active
US8787057B2	Fast analog memory cell readout using modified bit-line charging configurations	Physics	1	Active
US10332608B2	Memory block usage based on block location relative to array edge	Physics	0	Active
US9230680B2	Applications for inter-word-line programming	Physics	0	Active
US8837214B2	Applications for inter-word-line programming	Physics	0	Active
US9236132B2	Mitigating reliability degradation of analog memory cells during long static and erased state retention	Physics	0	Active
US9105311B2	Inter-word-line programming in arrays of analog memory cells	Physics	0	Active
US9672925B2	Storage in charge-trap memory structures using additional electrically-charged regions	Electricity	0	Active
US9455040B2	Mitigating reliability degradation of analog memory cells during long static and erased state retention	Physics	0	Active
US9312017B2	Storage in charge-trap memory structures using additional electrically-charged regions	Electricity	0	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.