Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing
US9606143B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 11, 2014 |
| Grant date | Mar 28, 2017 |
| Priority date | — |
| Expiry date | May 25, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2896
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device under test (DUT) has terminals connected to electrically conductive contacts which are in turn connect to a load board and to a test signal source. A second set of kelvin terminals are likewise connected to the DUT, but by pass the load board for connection to a test signal source. The kelvin terminals extend distally away from the DUT and are bonded to a flex circuit at their distal ends so that they make electrical and mechanical contact with the flex circuit. An intermediary terminal block receives the flex circuit and a ribbon cable or other wire connects to a test signal source. The entire circuit then circumvents the use of the load board.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.