Patent · US Active

Probe configuration and method of fabrication thereof

US9612258B2 · kind B2 · utility

2Cited by
1References
8Claims
0Family size

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Key dates

Filing dateOct 29, 2014
Grant dateApr 4, 2017
Priority date
Expiry dateJun 3, 2035

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB82Y35/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The disclosed technology relates generally to probe configurations, and more particularly to probe configurations and methods of making probe configurations that have a diamond body and a diamond layer covering at least an apex region of the diamond body. In one aspect, a method of fabricating a probe configuration includes forming a probe tip. Forming the probe tip includes providing a substrate and forming a recessed mold into the substrate on a first side of the substrate, wherein the recessed mold is shaped to form a probe body having an apex region. Forming the probe tip additionally includes forming a first diamond layer on the substrate on the first side, wherein forming the first diamond layer includes at least partially filling the recessed mold with the first diamond layer such that a probe body having an apex region is formed in the recessed mold. Forming the probe tip additionally includes patterning to remove at least partially the first diamond layer which surrounds the probe body, removing a substrate material surrounding at least the apex region of the probe body, and forming a second diamond layer covering at least the apex region of the probe body. The method addi…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.