Wilfried Vandervorst
27Patents
10h-index
27Co-inventors
75Inventor score
Filing activity: Mar 9, 1992 → Sep 23, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7598482B1 | Wavelength-sensitive detector with elongate nanostructures | Emerging Cross-Sectional Technologies | 76 | Active |
| US5723981A | Method for measuring the electrical potential in a semiconductor element | Emerging Cross-Sectional Technologies | 39 | Expired |
| US6201401A | Method for measuring the electrical potential in a semiconductor element | Emerging Cross-Sectional Technologies | 26 | Expired |
| US6091248A | Method for measuring the electrical potential in a semiconductor element | Emerging Cross-Sectional Technologies | 25 | Expired |
| US6328902A | Probe tip configuration and a method of fabrication thereof | Emerging Cross-Sectional Technologies | 24 | Expired |
| US5585734A | Method for determining the resistance and carrier profile of a semiconductor element using a scanning proximity microscope | Emerging Cross-Sectional Technologies | 20 | Expired |
| US6690008B2 | Probe and method of manufacturing mounted AFM probes | Emerging Cross-Sectional Technologies | 18 | Expired |
| US6504152B2 | Probe tip configuration and a method of fabrication thereof | Emerging Cross-Sectional Technologies | 15 | Expired |
| US5995912A | Database and method for measurement correction for cross-sectional carrier profiling techniques | Electricity | 14 | Expired |
| US6809317B2 | Method and apparatus for local surface analysis | Physics | 12 | Expired |
| US6756584B2 | Probe tip and method of manufacturing probe tips by peel-off | Emerging Cross-Sectional Technologies | 6 | Expired |
| US6823723B2 | Method and apparatus for performing atomic force microscopy measurements | Emerging Cross-Sectional Technologies | 3 | Expired |
| US7133128B2 | System and method for measuring properties of a semiconductor substrate in a non-destructive way | Physics | 3 | Expired |
| US5369372A | Method for resistance measurements on a semiconductor element with controlled probe pressure | Emerging Cross-Sectional Technologies | 2 | Expired |
| US9612258B2 | Probe configuration and method of fabrication thereof | Performing Operations; Transporting | 2 | Active |
| US10746759B2 | Method for determining the shape of a sample tip for atom probe tomography | Electricity | 1 | Active |
| US8484761B2 | Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereof | Physics | 1 | Active |
| US8232517B2 | Wavelength-sensitive detector comprising photoconductor units each having different types of elongated nanostructures | Emerging Cross-Sectional Technologies | 1 | Active |
| US9588137B2 | Method for determining local resistivity and carrier concentration using scanning spreading resistance measurement set-up | Performing Operations; Transporting | 1 | Active |
| US11549963B2 | Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample | Electricity | 0 | Active |
| US10495666B2 | Device and method for two dimensional active carrier profiling of semiconductor components | Electricity | 0 | Active |
| US10541108B2 | Method and apparatus for transmission electron microscopy | Electricity | 0 | Active |
| US10014178B2 | Method for differential heating of elongate nano-scaled structures | Electricity | 0 | Active |
| US8211812B2 | Method for fabricating a high-K dielectric layer | Electricity | 0 | Active |
| US11125805B2 | Device for measuring surface characteristics of a material | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.