Detecting occurrence of abnormality
US9625354B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 27, 2012 |
| Grant date | Apr 18, 2017 |
| Priority date | — |
| Expiry date | Mar 22, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG07C5/0808
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
A method, apparatus and computer program for detecting occurrence of an anomaly. The method can exclude arbitrariness and objectively judge whether a variation of a physical quantity to be detected is abnormal or not even when an external environment is fluctuating. The method includes acquiring multiple primary measurement values from a measurement target. Further, calculating and a reference value for each of the multiple primary measurement values by optimal learning. The method further includes calculating a relationship matrix which indicates mutual relationships between the multiple secondary measurement values. Further the method includes calculating an anomaly score for each of the secondary measurement value which indicates the degree of the measurement target being abnormal. The anomaly score is calculated by comparing the secondary measurement value with a predictive value which is calculated based on the relationship matrix and other secondary measurement values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.