Patent · US Active

Memory device error history bit

US9626242B2 · kind B2 · utility

3Cited by
1References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 26, 2015
Grant dateApr 18, 2017
Priority date
Expiry dateJun 26, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F13/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Classifying memory errors may include accessing data from a location within a memory array of a memory device. The memory array may include at least one bit field to store memory error classification information. One or more memory errors in the data may be determined. One or more memory errors may further be classified. In response to the classifying, memory error classification information may be stored as one or more bit values within the bit field.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.