Semiconductor device for performing repair operations
US9633750B2 · kind B2 · utility
4Cited by
5References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2015 |
| Grant date | Apr 25, 2017 |
| Priority date | — |
| Expiry date | Dec 18, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/44
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor device includes a fuse block configured to store repair information corresponding to a fail address, and output fuse data in a boot-up operation; a dummy mat formed in a predetermined region of a cell array, and configured to store the fuse data in the boot-up operation; and a repair latch block configured to store the fuse data in the boot-up operation, wherein the fuse data stored in the dummy mat are updated to and stored in the repair latch block in a refresh operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.