Patent · US Active

Positioner of probe card and probe head of probe card

US9638716B2 · kind B2 · utility

0Cited by

1References

15Claims

0Family size

Assignee

MPI CORPORATION · TW

Inventors

Tzu-Yang Chen · Cukeng, TW
Shang-Jung Hsieh · Taipei, TW
Chung-Tse Lee · Taipei, TW
Tsung-Yi Chen · Taipei, TW
Tien-Chia Li · Hengshan, TW
Chia-Yuan Kuo · Taipei, TW
Che-Wei Lin · New Taipei, TW

Key dates

Filing date	Dec 3, 2014
Grant date	May 2, 2017
Priority date	—
Expiry date	Dec 8, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/07357
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A positioner and a probe head of a probe card are provided. The positioner has a main opening, a first sub-opening, a second sub-opening, a third sub-opening, a fourth sub-opening, a first positioning portion, a second positioning portion, a first elastic portion and a second elastic portion. The first sub-opening, the second sub-opening, the third sub-opening, and the fourth sub-opening are sequentially arranged at the periphery of the main opening and are communicated to the main opening. A stiffness of the first positioning portion and a stiffness of the second positioning portion are higher than a stiffness of the first elastic portion and a stiffness of the second elastic portion.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.