Tzu-Yang Chen
4Patents
0h-index
11Co-inventors
31Inventor score
Filing activity: Dec 3, 2014 → May 28, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| USD983681S1 | Probe for testing device under test | General | 0 | Active |
| US11143674B2 | Probe head with linear probe | Physics | 0 | Active |
| US9638716B2 | Positioner of probe card and probe head of probe card | Physics | 0 | Active |
| US11493536B2 | Probe head with linear probe | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.