System and method for programming workpiece feature inspection operations for a coordinate measuring machine
US9639083B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2013 |
| Grant date | May 2, 2017 |
| Priority date | — |
| Expiry date | Apr 25, 2035 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/80
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A system and method are provided for programming workpiece feature inspection operations for a coordinate measuring machine. An editing environment is operated to display a 3-dimensional workpiece representation comprising a first surface feature of a workpiece. A first feature surface sampling pattern is created having at least one pattern parameter adjusted to correspond to a first surface feature of the workpiece. A corresponding representation of the sampling pattern includes operative sampling pattern locations located proximate to the first surface feature. User operations in the GUI further adjust pattern parameters of the sampling pattern. The further adjustment of the pattern parameters simultaneously affects a plurality of the sampling pattern locations. The sampling pattern representation may include various types of operative and inoperative sampling pattern locations, which may be displayed in a manner that distinguishes them from one another, such as by being represented with different colors, shapes or patterns.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.