Patent · US Active

Single-position hall effect measurements

US9644939B2 · kind B2 · utility

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5References
10Claims
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Key dates

Filing dateDec 21, 2011
Grant dateMay 9, 2017
Priority date
Expiry dateJul 14, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L22/34
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for determining an electrical property of a test sample having a conductive surface portion with an electrical boundary includes (a) determining a first distance between the single position and the boundary by (1) contacting the test sample with a first four-contact configuration of a multi-contact probe at the single position; (2) applying a magnetic field at the single position; (3) measuring first and second resistances from which to calculate a first resistance difference; (4) measuring third and fourth resistances from which to calculate a second resistance difference; (5) defining a first relation including parameters representing the first and second resistance differences and the first distance; (6) determining the first distance by using the first and second resistance differences in the first relation; (b) repeating steps (1)-(6) with a second four-contact configuration to determine a second distance between the single position and the boundary; (c) defining a second relation including the electrical property and a fourth parameter representing the second distance; and (d) employing the second distance as the fourth parameter in the second relation for determinin…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.