Patent · US Active

Alignment systems and wafer bonding systems and methods

US9646860B2 · kind B2 · utility

12Cited by
4References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 9, 2013
Grant dateMay 9, 2017
Priority date
Expiry dateOct 11, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/12042
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Alignment systems, and wafer bonding alignment systems and methods are disclosed. In some embodiments, an alignment system for a wafer bonding system includes means for monitoring an alignment of a first wafer and a second wafer, and means for adjusting a position of the second wafer. The alignment system includes means for feeding back a relative position of the first wafer and the second wafer to the means for adjusting the position of the second wafer before and during a bonding process for the first wafer and the second wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.