Method for ranking fault-test pairs based on waveform statistics in a mutation-based test program evaluation system
US9658947B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 15, 2013 |
| Grant date | May 23, 2017 |
| Priority date | — |
| Expiry date | Oct 24, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3692
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Ranking of fault-test pairs is performed using first and second multitudes of waveform statistics. The first multitude of waveform statistics includes first value-change information regarding variations in logics HIGH and LOW for each bit of each reference output resulting from a test run of the design code. The second multitude of waveform statistics includes second value-change information regarding variations in logics HIGH and LOW for each bit of each faulty output resulting from a test run of the design code injected with a fault. Relative differences between the first and second multitudes of waveform statistics for each bit of each faulty output with respect to the corresponding reference output are determined. A waveform difference based on the relative differences for each signal of each faulty output is determined. A ranking result of fault-test pairs is determined according to the waveform differences of the faulty outputs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.