Patent · US Active

Method and structure to contact tight pitch conductive layers with guided vias

US9659860B2 · kind B2 · utility

1Cited by
2References
20Claims
0Family size

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Key dates

Filing dateAug 21, 2013
Grant dateMay 23, 2017
Priority date
Expiry dateAug 21, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An apparatus including a circuit substrate; a first interconnect layer in a first plane on the substrate and a second interconnect layer in a different second plane on the substrate; and a hardmask layer separating the first interconnect layer and the second interconnect layer, wherein the hardmask layer comprises alternating guide sections comprising different hard mask materials, and a via guide. A method including forming a dielectric layer on an integrated circuit structure; forming a first interconnect layer having interconnect lines in the dielectric layer; forming a hardmask layer on a surface of the dielectric layer, the hardmask layer comprising alternating hardmask materials which form guide sections over the interconnect lines; forming a via guide in one of the guide sections; and forming a second interconnect layer over the hardmask guide layer which is electrically connected to one of the interconnect lines through the via guide.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.