Contact spring for a testing base for the high current testing of an electronic component

US9671428B2 · kind B2 · utility

Assignee

• Multitest Elektronische Systeme GmbH · DE

Inventors

• Gerhard Gschwendtberger · Brannenburg, DE
• Volker Leikermoser · Aschau, DE
• Manuel Petermann · Rosenheim, DE
• Marcus Frey · Weil der Stadt, DE

Key dates

• Filing date: Oct 22, 2013
• Grant date: Jun 6, 2017
• Expiry date: Aug 17, 2034

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/06738
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A contact spring for a testing base for high current testing of an electronic component, which is produced from a spring metal sheet of a predetermined thickness and possesses two identical opposing lateral faces, and which has a spring arm and a testing arm with a testing tip, where the testing arm forms an angle with the spring arm, which enables the testing tip to be positioned on a contact surface of the electronic component running approximately parallel to the spring arm, by relative movement between the testing base and the electronic component.