Apparatus and method of programming and verification for a nonvolatile semiconductor memory device
US9672926B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 29, 2013 |
| Grant date | Jun 6, 2017 |
| Priority date | — |
| Expiry date | Nov 10, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2211/5621
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
According to one embodiment, a nonvolatile semiconductor memory device includes a memory cell array and a control circuit configured to repeat a program operation and a verify operation. The control circuit performs a first verify operation of sensing whether threshold voltages of selected memory cells are greater than or equal to a first threshold voltage, and a second verify operation of sensing whether the threshold voltages of the selected memory cells are greater than or equal to a second threshold voltage (first threshold voltage<second threshold voltage), and the control circuit changes a charge voltage for the bit lines between the first verify operation and the second verify operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.