Abnormality diagnostic system and industrial machinery
US9678845B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 20, 2011 |
| Grant date | Jun 13, 2017 |
| Priority date | — |
| Expiry date | Sep 11, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG07C3/00
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
An object of the present invention is to provide an abnormality diagnostic system that can enhance diagnostic precision even if a computer arranged on the machine side does not have sufficient throughput in diagnosing a condition of a machine or equipment based upon time series data generated by a sensor and can reduce communication capacity because communication data volume decreases and industrial machinery provided with the abnormality diagnostic system. A diagnostic device on the machine side 2 diagnoses time series data generated by a sensor, acquires a primary diagnostic result, extracts time series data related to the primary diagnostic result and outputs it to a diagnostic device on the server side 3 together with the primary diagnostic result, the diagnostic device on the server side 3 diagnoses the time series data, acquires a secondary diagnostic result, and displays the secondary diagnostic result together with the primary diagnostic result. Besides, the diagnostic device on the server side compares the diagnostic results and updates a diagnostic process of the diagnostic device on the machine side 2 when the diagnostic results are different as a result of the compariso…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.