Patent · US Active

Test stand for XRF instrument enabling multi-way operation

US9683952B2 · kind B2 · utility

2Cited by
0References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 8, 2014
Grant dateJun 20, 2017
Priority date
Expiry dateApr 10, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2223/303
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Disclosed is a test stand that supports and stabilizes a handheld XRF analyzer, and holds a body of sample to be tested. The test stand allows both horizontal and vertical analysis positions of the analyzer. The preferred embodiment of the test stand comprises a shielded X-ray chamber in which samples are tested and which affixes to the XRF analyzer's window via a spring loaded handle, a stabilizing base to which the analyzer's handle is situated, and a stanchion for horizontal mounting of the XRF analyzer. In the horizontal orientation, the chamber contains an adjustable platform and soil sample retainer to facilitate the positioning of the sample to be tested. The stanchion can be stored under the base.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.