Accuracy and precision in raman spectroscopy
US9689743B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 26, 2012 |
| Grant date | Jun 27, 2017 |
| Priority date | — |
| Expiry date | Sep 15, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/65
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosure is related systems and method for improved accuracy and precision in Raman spectroscopy. In one embodiment, a device may comprise a Raman spectroscopic apparatus configured to determine a property of a sample by directing photons at the sample and measuring a resulting Raman scattering, a positioning apparatus capable of manipulating a position of the sample, and the device being configured to selectively adjust a focus of the Raman spectroscopic apparatus to adjust an intensity of the Raman scattering. Another embodiment may be a method comprising performing a depth focus Raman spectra screening on a sample to determine a depth focus with a maximum-intensity Raman spectra, wherein the depth focus spectra screening comprises performing Raman spectra scans on the sample at a plurality of depth foci, and modifying a process based on a result of the Raman spectra scan at the depth focus with the maximum-intensity Raman spectra.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.