Patent · US Active

Multi-focal structured illumination microscopy systems and methods

US9696534B2 · kind B2 · utility

5Cited by
3References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 22, 2013
Grant dateJul 4, 2017
Priority date
Expiry dateFeb 22, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/0633
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A multi-focal selective illumination microscopy (SIM) system for generating multi-focal patterns of a sample is disclosed. The multi-focal SIM system performs a focusing, scaling and summing operation on each multi-focal pattern in a sequence of multi-focal patterns that completely scan the sample to produce a high resolution composite image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.