Patent · US Active

Method of manufacturing element chip and element chip

US9698073B2 · kind B2 · utility

0Cited by
0References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 14, 2016
Grant dateJul 4, 2017
Priority date
Expiry dateSep 14, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2221/6834
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a plasma processing step in a method of manufacturing an element chip in which a plurality of element chips are manufactured by dividing a substrate, which has a plurality of element regions, the substrate is divided into element chips by exposing the substrate to first plasma. In a protection film forming step of forming a protection film covering a side surface and a second surface by exposing the element chips to second plasma of which raw material gas is mixed gas of carbon fluoride and helium, protection film forming conditions are set such that a thickness of a second protection film of the second surface is greater than a thickness of a first protection film of the side surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.