Patent · US Active

Packet based integrated circuit testing

US9702935B2 · kind B2 · utility

0Cited by

9References

20Claims

0Family size

Assignee

TEXAS INSTRUMENTS INCORPORATED · US

Inventors

Lewis Nardini · Dallas, US
Sumant Dinkar Kale · Allen, US
Alan Hales · Richardson, US

Key dates

Filing date	Aug 29, 2014
Grant date	Jul 11, 2017
Priority date	—
Expiry date	Jan 6, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318575
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Apparatus and method for testing an integrated circuit. An integrated circuit includes circuitry to be tested, scan chain logic, and a test adapter. The scan chain logic is configured to transfer test data to and test results from the circuitry. The test adapter is configured to extract the test data from a packet received from an automated test control system and to transfer the test data to the scan chain logic. The test adapter is also configured to receive the test results from the scan chain logic, and to packetize the test result for transmission to the automated test control system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.