Patent · US Active

Monomer for a hardmask composition, hardmask composition comprising the monomer, and method for forming a pattern using the hardmask composition

US9725389B2 · kind B2 · utility

1Cited by
7References
12Claims
0Family size

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Inventors

Key dates

Filing dateNov 29, 2012
Grant dateAug 8, 2017
Priority date
Expiry dateNov 29, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/31144
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Disclosed are a monomer for a hardmask composition represented by the following Chemical Formula 1, a hardmask composition including the monomer, and a method of forming a pattern using the same.In Chemical Formula 1, A, A′, L and n are the same as in the detailed description.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.