Method of analogue measurement scanning on a machine tool
US9726481B2 · kind B2 · utility
9Cited by
28References
15Claims
0Family size
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Key dates
| Filing date | Apr 16, 2013 |
| Grant date | Aug 8, 2017 |
| Priority date | — |
| Expiry date | Sep 24, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B19/401
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of building up a measurement data set for a surface of an object using an analog measurement probe mounted on a machine tool apparatus which obtains scanned measurement data of the surface over a plurality of offset traverses. Subsequent traverses are offset from previous traverses such that over a series of traverses the analog probe's surface detecting region progresses i) laterally across the object, and/or ii) away from or towards the object. The course of relative motion for at least one subsequent traverse is generated and/or updated based on data obtained during at least one previous traverse.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.