Method of finding a feature using a machine tool
US9733060B2 · kind B2 · utility
5Cited by
28References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 16, 2013 |
| Grant date | Aug 15, 2017 |
| Priority date | — |
| Expiry date | Jul 7, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of finding a feature of an object using an analogue probe mounted on a machine tool. The method includes the analogue probe and/or object following a course of motion which causes the analogue probe's surface sensing region to traverse across the feature to be found a plurality of times whilst approaching the feature over successive traverses so as to ultimately arrive in a position sensing relationship with the feature so as to collect scanned measurement data about the feature along at least part of a traverse.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.