SiC trench transistor and method for its manufacture
US9761706B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 21, 2014 |
| Grant date | Sep 12, 2017 |
| Priority date | — |
| Expiry date | Nov 21, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/8325
Abstract
An SiC trench transistor having a first terminal and an epitaxial layer positioned vertically between a gate trench and a second terminal; a compensation layer extending horizontally being provided in the epitaxial layer, the compensation layer having an effective doping of a type opposite to the doping of the epitaxial layer. A method for manufacturing an SiC trench transistor is also provided, an epitaxial layer being provided on a second terminal of the SiC trench transistor; a compensation layer extending horizontally being implanted in the epitaxial layer, the compensation layer having an effective doping of a type opposite to the doping of the epitaxial layer; and a first terminal and a gate trench being provided above the compensation layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.