Defect diagnosis
US9766286B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 20, 2014 |
| Grant date | Sep 19, 2017 |
| Priority date | — |
| Expiry date | May 10, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31707
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for diagnosing a defect is provided. A first candidate pair comprises a first defect candidate and a second defect candidate. A first pattern is generated to distinguish one or more faults of the first defect candidate from one or more faults of the second defect candidate. The first defect candidate is removed responsive to determining that the first pattern does not detect the first defect candidate and determining that an automatic test equipment (ATE) failure log associates the first pattern with failure. Removing the first candidate pair, as well as additional candidate pairs when possible, promotes diagnosis efficiency by reducing a number of computations required.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.