Ji-Jan Chen
17Patents
3h-index
32Co-inventors
56Inventor score
Filing activity: Sep 19, 2008 → May 26, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8832511B2 | Built-in self-test for interposer | Physics | 22 | Active |
| US8144756B2 | Jitter measuring system and method | Physics | 5 | Active |
| US10256828B2 | Phase-locked loop monitor circuit | Electricity | 3 | Active |
| US8707238B2 | Method to determine optimal micro-bump-probe pad pairing for efficient PGD testing in interposer designs | Physics | 3 | Active |
| US9269640B2 | Repairing monolithic stacked integrated circuits with a redundant layer and lithography process | Electricity | 3 | Active |
| US8113412B1 | Methods for detecting defect connections between metal bumps | Physics | 2 | Active |
| US8863062B2 | Methods and apparatus for floorplanning and routing co-design | Physics | 2 | Active |
| US10680627B2 | Phase-locked loop monitor circuit | Electricity | 2 | Active |
| US11025261B2 | Phase-locked loop monitor circuit | Electricity | 1 | Active |
| US8384455B2 | Apparatus for clock skew compensation | Physics | 1 | Active |
| US8614571B2 | Apparatus and method for on-chip sampling of dynamic IR voltage drop | Physics | 1 | Active |
| US9310431B2 | Diagnosis framework to shorten yield learning cycles of advanced processes | Physics | 0 | Active |
| US8051394B2 | Yield evaluating apparatus and method thereof | Physics | 0 | Active |
| US9766286B2 | Defect diagnosis | Physics | 0 | Active |
| US10156609B2 | Device and method for robustness verification | Electricity | 0 | Active |
| US11411571B2 | Phase-locked loop monitor circuit | Electricity | 0 | Active |
| US9847318B2 | Monolithic stacked integrated circuits with a redundant layer for repairing defects | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.