Method of producing a semiconductor device with protruding contacts
US9768131B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 14, 2015 |
| Grant date | Sep 19, 2017 |
| Priority date | — |
| Expiry date | Jan 14, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2224/13026
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A wiring (3) comprising electrical conductors (4, 5, 6, 7) is formed in a dielectric layer (2) on or above a semiconductor substrate (1), an opening is formed in the dielectric layer to uncover a contact pad (8), which is formed by one of the conductors, and a further opening is formed in the dielectric layer to uncover an area of a further conductor (5), separate from the contact pad. The further opening is filled with an electrically conductive material (9), and the dielectric layer is thinned from a side opposite the substrate, so that the electrically conductive material protrudes from the dielectric layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.