TFT backplate structure and manufacture method thereof
US9768200B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 19, 2014 |
| Grant date | Sep 19, 2017 |
| Priority date | — |
| Expiry date | Oct 19, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10K59/1213
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A TFT backplate structure and a manufacture method thereof are provided. The TFT backplate structure includes a switch TFT (T1) and a drive TFT (T2). The switch TFT (T1) is constructed by a first source electrode/a first drain electrode (61), a first gate electrode (21), and a first etching stopper layer (51), a first semiconductor layer (41), a first gate isolation layer (31) sandwiched in between. The drive TFT (T2) is constructed by a second source electrode/a second drain electrode (62), a second gate electrode (22), and a second etching stopper layer (52), a second semiconductor layer (42), a second gate isolation layer (32) sandwiched in between. The materials or the thicknesses of the first gate isolation layer (31) and the second gate isolation layer (32) are different. Accordingly, the electrical properties of the switch TFT (T1) and the drive TFT (T2) are different.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.