Patent · US Active

Method of forming micropatterns

US9773672B2 · kind B2 · utility

1Cited by
12References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 5, 2016
Grant dateSep 26, 2017
Priority date
Expiry dateFeb 5, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02326
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of manufacturing a semiconductor device, including forming an etching target film on a substrate; forming an anti-reflection film on the etching target film; forming a photoresist film on the anti-reflection film; exposing the photoresist film; performing heat treatment on the anti-reflection film and the photoresist film to form a covalent bond between the anti-reflection film and the photoresist film; and developing the photoresist film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.