Patent · US Active

Devices under test

US9778313B2 · kind B2 · utility

4Cited by
5References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 8, 2014
Grant dateOct 3, 2017
Priority date—
Expiry dateAug 26, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2623
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system can include a plurality of device under test (DUT) cells. Each DUT cell can include a DUT and a plurality of switches configured to control a flow of current to the DUT. The system can further include a controller configured to execute a plurality of test to the plurality of DUTs in the plurality of DUT cells. Each of the plurality of tests comprises applying a measurement condition to a given DUT of the plurality of DUTs and concurrently applying a stress condition to the remaining DUTs of the plurality of DUTs, wherein the plurality of tests can provide measurements sufficient to determine a bias thermal instability and a time dependent dielectric breakdown of the given DUT.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.