Vijay Reddy
26Patents
9h-index
25Co-inventors
75Inventor score
Filing activity: Aug 22, 2002 → Mar 8, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6815970B2 | Method for measuring NBTI degradation effects on integrated circuits | Physics | 32 | Expired |
| US9714966B2 | Circuit aging sensor | Physics | 22 | Active |
| US8138829B2 | Segmented power amplifier with varying segment activation | Electricity | 15 | Active |
| US6933731B2 | Method and system for determining transistor degradation mechanisms | Electricity | 14 | Expired |
| US9110111B1 | Methods and systems to determine a final value of random telegraph noise time constant and magnitude | Physics | 12 | Active |
| US9623082B2 | Methods and compositions for natural killer cells | Chemistry; Metallurgy | 9 | Active |
| US7212023B2 | System and method for accurate negative bias temperature instability characterization | Physics | 9 | Expired |
| US6963111B2 | Efficient pMOS ESD protection circuit | Electricity | 9 | Expired |
| US8753941B1 | High performance asymmetric cascoded transistor | Electricity | 9 | Active |
| US7196887B2 | PMOS electrostatic discharge (ESD) protection device | Electricity | 8 | Expired |
| US7218132B2 | System and method for accurate negative bias temperature instability characterization | Physics | 6 | Expired |
| US7385383B2 | Methods and systems for determining efficacy of stress protection circuitry | Electricity | 5 | Active |
| US7974595B2 | Methodology for assessing degradation due to radio frequency excitation of transistors | Physics | 4 | Active |
| US7026838B2 | Versatile system for accelerated stress characterization of semiconductor device structures | Physics | 4 | Expired |
| US9778313B2 | Devices under test | Physics | 4 | Active |
| US7952378B2 | Tunable stress technique for reliability degradation measurement | Physics | 4 | Active |
| US9035706B2 | Variability and aging sensor for integrated circuits | Physics | 3 | Active |
| US6709932B1 | Method for improving gate oxide integrity and interface quality in a multi-gate oxidation process | Electricity | 3 | Expired |
| US7737717B2 | Current-voltage-based method for evaluating thin dielectrics based on interface traps | Physics | 2 | Active |
| US10463715B2 | Methods and compositions for natural killer cells | Chemistry; Metallurgy | 2 | Active |
| US6928376B2 | Apparatus and methods for ferroelectric ram fatigue testing | Physics | 2 | Expired |
| US8239814B2 | Parameter drift prediction | Physics | 0 | Active |
| US10874715B2 | Methods and compositions for natural killer cells | Chemistry; Metallurgy | 0 | Active |
| US11617781B2 | Methods and compositions for natural killer cells | Chemistry; Metallurgy | 0 | Active |
| US7263455B2 | Apparatus and methods for ferroelectric ram fatigue testing | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.