Semiconductor test system during burn-in process
US9779837B1 · kind B1 · utility
2Cited by
1References
19Claims
0Family size
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Key dates
| Filing date | Aug 18, 2016 |
| Grant date | Oct 3, 2017 |
| Priority date | — |
| Expiry date | Aug 18, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/4401
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A command generation circuit, test control circuit, semiconductor device, semiconductor system, and or a test method may be provided. The semiconductor device may be configured to enter test modes and to generate internal commands during a clock cycle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.