Method, apparatus and system providing adjustment of pixel defect map
US9781365B2 · kind B2 · utility
3Cited by
9References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 17, 2013 |
| Grant date | Oct 3, 2017 |
| Priority date | — |
| Expiry date | Jul 4, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/683
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method, apparatus and system that allows for the identification of defective pixels, for example, defective pixel clusters, in an imager device. The method, apparatus and system determine, during use of the imager device, that a pixel defect, e.g., cluster defect, exists and accurately maps the location of the defective pixel. By analyzing more than one frame of an image, the method increases the accuracy of the defect mapping, which is used to improve the quality of the resulting image data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.