Full pad coverage boundary scan
US9791505B1 · kind B1 · utility
4Cited by
22References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 29, 2016 |
| Grant date | Oct 17, 2017 |
| Priority date | — |
| Expiry date | Apr 29, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318572
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit, comprising functional circuitry and testing circuitry. A first set of pads is operable in a first state for communicating testing signals to the testing circuitry and operable in a second state for communicating input/output signals to the functional circuitry. A second set of pads, differing from the first set of pads, is operable in the second state for communicating testing signals to the testing circuitry for testing signals associated in the second state with the first set of pads.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.