Static random-access memory (SRAM) sensor for bias temperature instability
US9812188B2 · kind B2 · utility
1Cited by
3References
30Claims
0Family size
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Key dates
| Filing date | Feb 25, 2015 |
| Grant date | Nov 7, 2017 |
| Priority date | — |
| Expiry date | Feb 25, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An apparatus includes a static random-access memory and circuitry configured to initiate a corrective action associated with the static random-access memory. The corrective action may be initiated based on a number of static random-access memory cells that have a particular state responsive to a power-up of the static random-access memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.