Apparatus and method for testing an analog-to-digital converter
US9819353B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2016 |
| Grant date | Nov 14, 2017 |
| Priority date | — |
| Expiry date | Sep 30, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1245
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A method for use in testing an analog-to-digital converter. The method includes providing a set of bins, varying a voltage, taking samples of the voltage, providing a selection flag, associating each sample with one bin of the set of bins, and observing a number of samples associated with the bins. An apparatus includes an analog-to-digital converter configured to convert a voltage at an input node to a digital representation provided at an output node. The input node is configured to be coupled to a voltage generator. A sample select unit is configured to determine if a voltage at the input node at least equals a first threshold level and does not exceed a second threshold level. The apparatus is configured, based on the determining, to selectively associate the digital representation with a bin of a set of bins.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.