Noise modulation for on-chip noise measurement
US9835665B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 9, 2014 |
| Grant date | Dec 5, 2017 |
| Priority date | — |
| Expiry date | Nov 26, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3187
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Functionality for estimating characteristics of an on-chip noise signal can be implemented on a processing module. An on-chip noise signal is determined at an on-chip determination point of a computer chip. The on-chip noise signal is converted to a frequency-varying signal using a voltage-controlled oscillator implemented on the computer chip. The frequency-varying signal is measured at an off-chip measurement point and frequency information is extracted from the frequency-varying signal. The frequency information is converted to a voltage level associated with the on-chip noise signal based on the relationship between an input voltage provided to the voltage-controlled oscillator and an output frequency generated by the voltage-controlled oscillator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.